Posts

Showing posts from March, 2014

Test Specification Language – the past, present and the future

Image
At DVCon-14, leading EDA vendor MENT has taken the initiative to propose a Test Specification Standard (see: http://www.goo.gl/BKuNEd ). Given that SV & UVM are well established and deep into their development, stability and adoption phase, the innovation has to come at next level of abstraction. Over the last decade, we at CVC have been working with customers (semiconductor design houses) and EDA partners in defining, evangelizing and deploying multitude of technologies and languages such as OVL, e/Specman, eRM, PSL, SVA, SV, VMM, OVM, AVM, UVM etc. While most of them address the key aspects of "how verification shall be effectively carried out", the next level of "What defines my verification space" has been left for adjacent technologies. Now with this new initiative we are starting to see this problem being addressed. Here is a quick summary of various attempts that have been made to address this problem so far. Hopefully the new Accellera committee will loo...